infrared reflection absorption spectroscopy
常见例句
- The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.
利用橢圓偏振光譜、反射譜、紅外吸收譜和準穩態光電導（QSSPC）分析了氮化矽薄膜的特性。 返回 infrared reflection absorption spectroscopy