Auger electron
常见例句
- Microstructures of thin films are characterized by X-ray Diffraction (XRD) and auger Electron spectroscopy (AES).
通过X射线衍射(XRD)和俄歇电子能谱(AES)分析研究了薄膜的微结构; - The structure and chemical compositions of the surface oxide film were investigated by XRD and Auger electron spectrometry (AES).
利用X射线衍射(XRD)和俄歇电子衍射(AES)观察了表面膜的化学成分及结构。 - The characteristics of the electron_injected film were analyzed and discussed, in terms of the microstructure analyses in the film with the Auger electron spectroscopy and the infrared spectrum.
结合俄歇电子能谱和红外光谱分析膜的微观结构,对薄膜的电子注入特性进行了理论分析与讨论。 返回 Auger electron